\t\t\t\tRepair of XPS of Ar + ion gun has been completed.<\/p>\n
As usual, it is possible that contamination removal and depth profile by Ar+ ion etching<\/p>\n
With the maintenance of ion gun, there is a change in the XPS settings. Please check it.<\/p>\n
\u30fbChanging the angle aperture and the field aperture values for setting the measurement area 1mm\u03c6. Each new values are\u00a0 34 and 14 from 32 and 12.<\/p>\n
\u30fbThe etching rate of Ar+ ion gun is changed in each channel.<\/p>\n
Ch1: 10.0nm \/ min<\/p>\n
Ch2: 5.6nm \/ min<\/p>\n
Ch3: 1.5nm \/ min<\/p>\n
Ch4 (Tilt-10 \u00b0 at the time): 12.0nm \/ min<\/p>\n
Please check the latest XPS measurement simple manual.<\/p>\n
Ch4(Tilt-10\u00b0\u6642): 12.0nm\/min<\/p>\n